RC-SCR: A novel low-voltage ESD protection circuit with new triggering mechanism

被引：0
|
作者：
Feng, H [1 ]
Zhan, R [1 ]
Wu, Q [1 ]
Chen, G [1 ]
Guan, X [1 ]
Wang, AZ [1 ]
机构：
[1] IIT, Dept Elect & Comp Engn, Integrated Elect Lab, Chicago, IL 60616 USA
来源：
APCCAS 2002: ASIA-PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS, VOL 2, PROCEEDINGS | 2002年
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Several techniques exist to realize low triggering of SCR (Si-controlled rectifier) ESD (electrostatic discharging) protection structures in CMOS technologies. This paper reports a novel RC-SCR (RC-coupled SCR) ESD protection circuit using a new RC-coupling-based triggering mechanism to further reduce triggering voltage. Implementation in a commercial 0.35mum CMOS process results in a very low triggering of 7V, representing a 28% further reduction from existing low-triggering-voltage SCR ESD protection designs.
引用
收藏
页码：97 / 100
页数：4
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