Compact and Low Leakage Devices for Bidirectional Low-Voltage ESD Protection Applications

被引:9
|
作者
Du, Feibo [1 ]
Qing, Yihong [1 ]
Hou, Fei [2 ]
Zou, Kepeng [1 ]
Song, Wenqiang [1 ]
Chen, Ruibo [3 ]
Liu, Jizhi [1 ]
Chen, Le [1 ]
Liou, Juin J. [4 ]
Liu, Zhiwei [1 ]
机构
[1] Univ Elect Sci & Technol China, Ctr Adv Semicond & Integrated Microsyst, Chengdu 611731, Peoples R China
[2] Chengdu Univ, Sch Elect Informat & Elect Engn, Chengdu 610106, Peoples R China
[3] Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
[4] Shenzhen Univ, Coll Elect & Informat Engn, Shenzhen 518060, Peoples R China
关键词
Electrostatic discharges; Leakage currents; Layout; Partial discharges; Semiconductor diodes; Parasitic capacitance; Low voltage; Electrostatic discharge (ESD); silicon-controlled rectifier (SCR); leakage current; area efficiency; low-voltage;
D O I
10.1109/LED.2021.3054964
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In advanced charged device model (CDM) protection engineering, it is necessary to provide dedicated dual-directional electrostatic discharge (ESD) protection between input/output (I/O) and ground (GND) to discharge the large amount of charge stored in the silicon substrate efficiently. This letter presents two improved bidirectional and low-voltage silicon-controlled rectifiers (BLVSCR-type1 and BLVSCR-type2), which are composed of two diode-triggered SCRs of opposite polarity in parallel. By improving the device structure and metal connection, the BLVSCR-type1 and BLVSCR-type2 can offer robust ESD capabilities. Compared with the conventional bidirectional direct-connected SCR (BDCSCR), experimental results show that the proposed BLVSCR-type1 can render a three order of magnitude reduction in the leakage current at a 1.2V I/O port and more stable parasitic capacitance characteristic. Moreover, the BLVSCR-type2 can possess a compact layout area reduced by as much as 35% when comparing to BLVSCR-type1.
引用
收藏
页码:391 / 394
页数:4
相关论文
共 50 条
  • [1] A novel low trigger voltage low leakage SCR for low-voltage ESD protection
    Liu, Jizhi
    Yang, Feilong
    Liu, Yilin
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2024, 39 (02)
  • [2] Optimized pMOS-Triggered Bidirectional SCR for Low-Voltage ESD Protection Applications
    Wang, Zhixin
    Sun, Ruei-Cheng
    Liou, Juin J.
    Liu, Don-Gey
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (07) : 2588 - 2594
  • [3] Study on ESD Protection Design with Stacked Low-Voltage Devices for High-Voltage Applications
    Dai, Chia-Tsen
    Ker, Ming-Dou
    [J]. 2014 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2014,
  • [4] Bidirectional Diode-Triggered Silicon-Controlled Rectifiers for Low-Voltage ESD Protection
    Liu, Wen
    Liou, Juin J.
    Yeh, Han-Chih
    Wang, Huei
    Li, You
    Yeo, Kiat Seng
    [J]. IEEE ELECTRON DEVICE LETTERS, 2012, 33 (10) : 1360 - 1362
  • [5] A Novel Voltage Divider Trigger SCR With Low Leakage Current for Low-Voltage ESD Application
    Liu, Jizhi
    Liu, Yilin
    Han, Aoran
    Nie, Yanlin
    Huang, Qiupei
    Liu, Zhiwei
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2022, 69 (05) : 2534 - 2542
  • [6] Comparison Between High-Holding-Voltage SCR and Stacked Low-Voltage Devices for ESD Protection in High-Voltage Applications
    Dai, Chia-Tsen
    Ker, Ming-Dou
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (02) : 798 - 802
  • [7] A Novel Capacitance-Coupling-Triggered SCR for Low-Voltage ESD Protection Applications
    Li, Mingliang
    Dong, Shurong
    Liou, Juin J.
    Song, Bo
    Han, Yan
    [J]. IEEE ELECTRON DEVICE LETTERS, 2010, 31 (10) : 1089 - 1091
  • [8] ESD protection of the high voltage tolerant pins in low-voltage BiCMOS processes
    Vashchenko, VA
    ter Beek, M
    Kindt, W
    Hopper, P
    [J]. PROCEEDING OF THE 2004 BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, 2004, : 277 - 280
  • [9] Tunable Low-Voltage Dual-Directional ESD Protection for RFICs
    Liu, Jian
    Lin, Lin
    Wang, Xin
    Zhao, Hui
    Tang, He
    Fang, Qiang
    Wang, Albert
    Yang, Liwu
    Xie, Haolu
    Fan, Siqiang
    Zhao, Bin
    Zhang, Gary
    Wang, Xingang
    [J]. 2011 IEEE RADIO AND WIRELESS SYMPOSIUM (RWS), 2011, : 279 - 282
  • [10] π-SCR Device for Broadband ESD Protection in Low-Voltage CMOS Technology
    Lin, Chun-Yu
    Lai, Yu-Hsuan
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2019, 66 (09) : 4107 - 4110