共 50 条
- [21] A 16b 10MS/s Digitally Self-Calibrated ADC with Time Constant Control PROCEEDINGS OF THE IEEE 2008 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 2008, : 113 - +
- [24] A Power Reduction Method for Scan Testing in Ultra-Low Power Designs 2021 IEEE 30TH ASIAN TEST SYMPOSIUM (ATS 2021), 2021, : 141 - 141
- [25] Reduction of testing time in structural durability proof Materialpruefung/Materials Testing, 2003, 45 (04): : 133 - 144
- [26] Designs fabrications and testing of a mechanical time delay micro-mechanism MEMS 2005 Miami: Technical Digest, 2005, : 367 - 370
- [27] Real Time Digitally Assisted Analog Motion Artifact Reduction in Ambulatory ECG Monitoring System 2012 ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE ENGINEERING IN MEDICINE AND BIOLOGY SOCIETY (EMBC), 2012, : 2096 - 2099
- [28] Fabrication and Testing of Bioinspired Surface Designs for Friction Reduction at the Piston Ring and Liner Interface JOURNAL OF TRIBOLOGY-TRANSACTIONS OF THE ASME, 2021, 143 (05):
- [29] A methodology for test time reduction in rubber part testing CONSTITUTIVE MODELS FOR RUBBER III, 2003, : 27 - 32
- [30] TEST TIME REDUCTION THROUGH OPTIMAL DEGRADATION TESTING INTERNATIONAL JOURNAL OF RELIABILITY QUALITY & SAFETY ENGINEERING, 2010, 17 (05): : 495 - 503