Guidelines for a Reliable Analysis of Random Telegraph Noise in Electronic Devices

被引:24
|
作者
Puglisi, Francesco Maria [1 ]
Pavan, Paolo [1 ]
机构
[1] Univ Modena & Reggio Emilia, Dipartimento Ingn Enzo Ferrari, I-41125 Modena, Italy
关键词
Factorial hidden Markov model (FHMM); noise analysis; noise measurement; random telegraph noise (RTN); trap spectroscopy; RTS NOISE; RRAM; EXTRACTION;
D O I
10.1109/TIM.2016.2518880
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we propose new guidelines for the analysis of random telegraph noise (RTN) in electronic devices. Starting from an in-depth understanding of RTN signal characteristics, we will identify the correct measurement conditions to enable RTN analysis as a characterization tool for electronic devices. The estimate of RTN statistical parameters may indeed strongly depend on the choice of measurement conditions. We will carefully consider both the measurement limits and the extraction process constraints to devise a strategy to identify RTN signals measured in conditions allowing a meaningful estimation of their parameters. The proposed strategy will be tested on a variety of different RTN signals and operating conditions.
引用
收藏
页码:1435 / 1442
页数:8
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