New Analysis Methods for Comprehensive Understanding of Random Telegraph Noise

被引：0
|
作者：
Nagumo, T. [1 ]
Takeuchi, K. [1 ]
Yokogawa, S. [2 ]
Imai, K. [2 ]
Hayashi, Y. [1 ]
机构：
[1] NEC Elect Corp, LSI Fundamental Res Lab, 1120 Shimokuzawa, Kanagawa 2291198, Japan
[2] NEC Elect Corp, Adv Device Dev Div, Kanagawa 2291198, Japan
来源：
2009 IEEE INTERNATIONAL ELECTRON DEVICES MEETING | 2009年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
New analysis methods useful for understanding both complex waveforms and statistical behaviors of Random Telegraph Noise (RTN) are proposed. Complex waveforms are clearly visualized using Time Lag Plots. Bias dependence of statistically extracted average trap number is discussed, with emphasis on the importance of undetectable traps on product reliability.
引用
收藏
页码：709 / +
页数：2
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