Testable path delay fault cover for sequential circuits

被引：13
|
作者：
Krstic, A [1 ]
Chakradhar, ST [1 ]
Cheng, KT [1 ]
机构：
[1] UNIV CALIF SANTA BARBARA,DEPT ECE,SANTA BARBARA,CA 93106
来源：
EURO-DAC '96 - EUROPEAN DESIGN AUTOMATION CONFERENCE WITH EURO-VHDL '96 AND EXHIBITION, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/EURDAC.1996.558208
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：220 / 226
页数：7
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