FITD simulation of terahertz near-field microscopes

被引：0
|
作者：
Lee, K. [1 ]
Yun, S. [1 ]
Cho, A. [1 ]
Park, H. [1 ]
Kim, J. [1 ]
Han, H. [1 ]
Park, J. [2 ]
机构：
[1] Pohang Univ Sci & Technol, Dept Elect & Comp Engn, Pohang 790784, South Korea
[2] Ajou Univ, Dept Elect & Comp Engn, Suwon 443749, South Korea
来源：
CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS | 2006年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The spatial resolutions of conventional THz TDS systems are limited by diffraction. In this work, we present a numerical analysis of apertureless THz pulse near-field microscopy (NFM), and successfully demonstrate that the THz NFNI can have nanometer-scale resolution. For the numerical analysis we used CST NIWS, a commercial software based on finite integral time domain (FITD) method. It is found that the THz near field is strongly localized around the probe tip as expected, which is of importance for nanometer resolution.
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页码：435 / 435
页数：1
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