Near-field microscopes speed up

被引：0
|
作者：
Robinson, K
机构：
来源：
PHOTONICS SPECTRA | 1998年 / 32卷 / 01期
关键词：
D O I：
暂无
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：38 / 38
页数：1
相关论文
共 50 条
  • [1] NEAR-FIELD MICROSCOPES BEAT THE WAVELENGTH LIMIT
    POOL, R
    [J]. SCIENCE, 1988, 241 (4861) : 25 - 26
  • [2] FITD simulation of terahertz near-field microscopes
    Lee, K.
    Yun, S.
    Cho, A.
    Park, H.
    Kim, J.
    Han, H.
    Park, J.
    [J]. CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS, 2006, : 435 - 435
  • [3] Applications of near-field microscopes to cell biology
    Barbet, J
    Thimonier, J
    RoccaSerra, J
    [J]. FLOW AND IMAGE CYTOMETRY, 1996, 95 : 229 - 236
  • [4] THz Near-Field Microscopes: Optimum Operation Conditions
    Do, Youngwoong
    Lee, Soonsung
    Moon, Kiwon
    Kim, Jin-Woo
    Han, Haewook
    [J]. 2017 42ND INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ), 2017,
  • [5] Numerical simulation of apertureless terahertz near-field microscopes
    Lee, K.
    Kim, J.
    Park, H.
    Han, H.
    Park, I.
    Lim, H.
    [J]. 2007 PACIFIC RIM CONFERENCE ON LASERS AND ELECTRO-OPTICS, VOLS 1-4, 2007, : 443 - 444
  • [6] NEAR-FIELD OPTICAL MICROSCOPES BREAK THE DIFFRACTION LIMIT
    MOYER, P
    VANSLAMBROUCK, T
    [J]. LASER FOCUS WORLD, 1993, 29 (10): : 105 - 109
  • [7] Depth structure analysis by surface scanning in near-field microscopes
    Sao, Mayu
    Takeda, Satoru
    Inami, Wataru
    Kawata, Yoshimasa
    [J]. OPTICS LETTERS, 2020, 45 (22) : 6302 - 6305
  • [8] Artefacts in polarization modulation scanning near-field optical microscopes
    Micheletto, R.
    Allegrini, M.
    Kawakami, Yoichi
    [J]. JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, 2007, 9 (05): : 431 - 434
  • [9] Quantitative analysis and measurements of near-field interactions in terahertz microscopes
    Moon, Kiwon
    Jung, Euna
    Lim, Meehyun
    Do, Youngwoong
    Han, Haewook
    [J]. OPTICS EXPRESS, 2011, 19 (12): : 11539 - 11544
  • [10] BLOCK DIAGRAMS AND MAIN ELEMENTS OF NEAR-FIELD SCANNING OPTICAL MICROSCOPES
    VORONIN, YM
    [J]. JOURNAL OF OPTICAL TECHNOLOGY, 1995, 62 (06) : 344 - 351
12345