Terahertz near-field microspectroscopy

被引：19
|
作者：
Knab, J. R. [1 ]
Adam, A. J. L. [1 ]
Chakkittakandy, R. [1 ]
Planken, P. C. M. [1 ]
机构：
[1] Delft Univ Technol, Dept Imaging Sci & Technol, Fac Sci Appl, Opt Res Grp, NL-2628 CJ Delft, Netherlands
来源：
APPLIED PHYSICS LETTERS | 2010年 / 97卷 / 03期
关键词：
circular waveguides; dielectric materials; dielectric waveguides; near-field scanning optical microscopy; THZ SPECTROSCOPY; WAVE-GUIDES; ARRAYS; APERTURES; METAL; HOLE;
D O I：
10.1063/1.3467192
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Using near-field, terahertz time-domain spectroscopy (THz-TDS), we investigate how the addition of a dielectric material into a subwavelength-diameter, cylindrical waveguide affects its transmission properties. The THz electric near-field is imaged with deep subwavelength resolution as it emerges from filled and unfilled waveguides. Spectroscopic data measured for waveguides filled with polycrystalline D-tartaric acid, and with polyethylene and silicon powders, illustrate the feasibility of this approach for obtaining spectroscopic information from a tiny sample volume. (C) 2010 American Institute of Physics. [doi:10.1063/1.3467192]
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页数：3
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