Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy

被引：3
|
作者：
Peng, Zhaomin [1 ,2 ]
Zhang, Dehai [1 ]
Ge, Shuqi [1 ,2 ]
Meng, Jin [1 ]
机构：
[1] Chinese Acad Sci, Natl Space Sci Ctr, Key Lab Microwave Remote Sensing, Beijing 100190, Peoples R China
[2] Univ Chinese Acad Sci, Sch Elect Elect & Commun Engn, Beijing 100049, Peoples R China
来源：
APPLIED SCIENCES-BASEL | 2023年 / 13卷 / 06期
关键词：
terahertz technology; scattering-scanning near-field optical microscopy; finite element model; near-field interactions; edge effect; antenna effect; SCATTERING; NANOSCOPY;
D O I：
10.3390/app13063400
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Terahertz scattering-scanning near-field optical microscopy (THz s-SNOM), combining the best features of terahertz technology and s-SNOM technology, has shown unique advantages in various applications. Consequently, building a model to characterize near-field interactions and investigate practical issues has become a popular topic in THz s-SNOM research. In this study, a finite element model (FEM) is proposed to quantify the near-field interactions, and to investigate the edge effect and antenna effect in THz s-SNOM. Our results indicate that the proposed model can give us a better understanding of the near-field interactions and direct the parameter design of the probe for THz s-SNOM.
引用
收藏
页数：13
相关论文
共 50 条
  • [1] Terahertz near-field microscopy
    Chen, HT
    Cho, GC
    Kersting, R
    [J]. NANOSENSING: MATERIALS AND DEVICES, 2004, 5593 : 533 - 544
  • [2] Terahertz near-field microscopy
    Kersting, Roland
    Buersgens, Federico F.
    Acuna, Guillermo
    Cho, Gyu Cheon
    [J]. ADVANCES IN SOLID STATE PHYSICS, 2008, 47 : 203 - +
  • [3] Terahertz Near-Field Microscopy of Metamaterials
    Sulollari, N.
    Keeley, J.
    Park, S. J.
    Rubino, P.
    Burnett, A. D.
    Li, L.
    Rosamond, M. C.
    Linfield, E. H.
    Davies, A. G.
    Cunningham, J. E.
    Dean, P.
    [J]. 2022 47TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER AND TERAHERTZ WAVES (IRMMW-THZ 2022), 2022,
  • [4] NEAR-FIELD MICROSCOPY AND NEAR-FIELD OPTICS
    COURJON, D
    BAINIER, C
    [J]. REPORTS ON PROGRESS IN PHYSICS, 1994, 57 (10) : 989 - 1028
  • [5] Towards terahertz near-field microscopy
    van der Valk, NCJ
    Planken, PCM
    [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2004, 362 (1815): : 315 - 319
  • [6] Quantitative analysis and measurements of near-field interactions in terahertz microscopes
    Moon, Kiwon
    Jung, Euna
    Lim, Meehyun
    Do, Youngwoong
    Han, Haewook
    [J]. OPTICS EXPRESS, 2011, 19 (12): : 11539 - 11544
  • [7] Towards terahertz near-field microscopy - Discussion
    Zhang, XC
    Planken, PCM
    Withington, S
    Havenith, M
    Unterrainer, K
    Faist, J
    Van der Weide, D
    Johnston, M
    Newnham, D
    Roskos, H
    [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2004, 362 (1815): : 319 - 321
  • [8] Enhancement Effects of the Terahertz Near-Field Microscopy
    Huang, Jian
    Yang, Zhongbo
    Wei, Dongshan
    Du, Chunlei
    Cui, Hong-Liang
    [J]. APPLIED SCIENCES-BASEL, 2015, 5 (04): : 1745 - 1755
  • [9] Terahertz near-field microspectroscopy
    Knab, J. R.
    Adam, A. J. L.
    Chakkittakandy, R.
    Planken, P. C. M.
    [J]. APPLIED PHYSICS LETTERS, 2010, 97 (03)
  • [10] Terahertz near-field microscope
    Park, H.
    Kim, J.
    Kim, M.
    Han, H.
    Park, I.
    [J]. Conference Digest of the 2006 Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics, 2006, : 13 - 13
12345