Terahertz near-field microscope

被引：0
|
作者：
Park, H. [1 ]
Kim, J. [1 ]
Kim, M. [1 ]
Han, H. [1 ]
Park, I. [1 ]
机构：
[1] Pohang Univ Sci & Technol, Dept Elect & Comp Engn, Pohang 790784, South Korea
来源：
Conference Digest of the 2006 Joint 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics | 2006年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report a terahertz pulse apertureless near-field microscope (THz NFM) which combines THz time domain spectroscopy (THz-TDS) and atomic force microscopy (AFM) techniques. By scanning the probe over a GaAs/Au edge, it is found that the THz NFM has a lateral resolution of similar to 80 nut.
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页码：13 / 13
页数：1
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