A test algorithm for multiple-valued logic combinational circuits

The new test algorithm designed for multiple-valued logic combinational circuits is a generalization of the D-algorithm and detects single faults in circuit production technologies. D-cubes of multiple-valued logic circuits are formed by computing the directional logical derivatives of the functions they implement. The algorithm is invariant to the type of the multiple-valued logic gates or the class of detected errors in a circuit. A classification of the faults in such circuits is given and the results of an experiment are presented.