Method of scanning near-field optical lithography

被引:0
|
作者
Dryakhlushin, VF [1 ]
Vostokov, NV [1 ]
Klimov, AY [1 ]
Rogov, VV [1 ]
Shashkin, VI [1 ]
机构
[1] Russian Acad Sci, Inst Phys Microstruct, Nizhnii Novgorod 603600, Russia
关键词
D O I
10.1109/CRMICO.2002.1137312
中图分类号
TN [电子技术、通信技术];
学科分类号
0809 ;
摘要
A contact scanning near-field optical lithography method has been developed to enable fabrication of different nanoelements (metal, dielectric, etched in surface or its combinations) on the various surfaces (metal, dielectric, light- and heavy doped semiconductors). The method involves interaction of heated probe of scanning near-field optical microscope with two-layer coating, followed by pattern transfer onto sample surface. The software for creation of different nanoelements is developed. The nanoelements with characteristic dimensions of about 50 nm are fabricated.
引用
下载
收藏
页码:453 / 454
页数:2
相关论文
共 50 条
  • [31] Femtosecond near-field scanning optical microscopy
    Nechay, BA
    Siegner, U
    Achermann, M
    Morier-Genaud, F
    Schertel, A
    Keller, U
    JOURNAL OF MICROSCOPY-OXFORD, 1999, 194 : 329 - 334
  • [32] A probe for a near-field scanning optical microscope
    Inst for Physics of Microstructures, Nizhnij Novgorod, Russia
    Prib Tekh Eksp, 2 (138-139):
  • [33] Near-field scanning optical microscopy and polymers
    Rucker, M
    DeSchryver, FC
    Vanoppen, P
    Jeuris, K
    DeFeyter, S
    Hotta, J
    Masuhara, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 131 (1-4): : 30 - 37
  • [34] Near-field scanning optical microscopy of nanostructures
    Department of Chemistry, University of California, Santa Barbara, CA 93106-9510, United States
    Phase Transitions, 1 (27-57):
  • [35] Contact scanning near-field optical microscopy
    Lapshin, DA
    Sekatskii, SK
    Letokhov, VS
    Reshetov, VN
    JETP LETTERS, 1998, 67 (04) : 263 - 268
  • [36] Differential near-field scanning optical microscopy
    Ozcan, Aydogan
    Cubukcu, Ertugrul
    Bilenca, Alberto
    Crozier, Kenneth B.
    Bouma, Brett E.
    Capasso, Federico
    Tearney, Guillermo J.
    NANO LETTERS, 2006, 6 (11) : 2609 - 2616
  • [37] Contact scanning near-field optical microscopy
    Lapshin, D.A.
    Reshetov, V.N.
    Sekatskii, S.K.
    Letokhov, V.S.
    JETP Letters (Translation of Pis'ma v Zhurnal Eksperimental'noi Teoreticheskoi Fiziki), 1998, 67 (04):
  • [38] Applications of near-field scanning optical microscopy
    Hess, HF
    Betzig, E
    SEMICONDUCTOR CHARACTERIZATION: PRESENT STATUS AND FUTURE NEEDS, 1996, : 395 - 398
  • [39] A compact near-field scanning optical microscope
    Merritt, G
    Monson, E
    Betzig, E
    Kopelman, R
    ULTRAMICROSCOPY, 1998, 71 (1-4) : 183 - 189
  • [40] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)
    POHL, DW
    FISCHER, UC
    DURIG, UT
    JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 853 - 861