Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits using Wavelets

被引：1
|
作者：
Spyronasios, A. D. [1 ]
Dimopoulos, M. G. [2 ]
Papadopoulos, N. P. [1 ]
Hatzopoulos, A. A. [1 ]
机构：
[1] Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece
[2] Alexander Technol Educ Inst Thessaloniki, Dept Elect, Thessaloniki, Greece
来源：
IEEE ANNUAL SYMPOSIUM ON VLSI (ISVLSI 2010) | 2010年
关键词：
Circuit Testing; Mixed-Signal Integrated Circuit Testing; Wavelets; Mahalanobis Distance; SUPPLY CURRENT TEST; ANALOG;
D O I：
10.1109/ISVLSI.2010.36
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper a test method for testing both parametric and catastrophic faults in analog and mixed signal Integrated Circuits (ICs) is presented. It is based on the wavelet transformation of the measured signal, be it supply current (IPS) or output voltage (VOUT) waveform. The tolerance limit for the good or reference IC is set by statistical processing data obtained from a set of fault-free ICs. In the wavelet analysis, two test metrics one named discrimination factor and one utilizing Mahalanobis distances are introduced. Both metrics rely on wavelet energy computation. Results from the application of the proposed method in testing known analog and mixed signal IC benchmarks are presented showing the effectiveness of the proposed testing scheme.
引用
收藏
页码：232 / 237
页数：6
相关论文
共 50 条
  • [21] Testing Digital Circuits Using a Mixed-Signal Automatic Test Equipment
    Radu, Mihaela
    2014 IEEE INTERNATIONAL CONFERENCE ON AUTOMATION, QUALITY AND TESTING, ROBOTICS, 2014,
  • [22] Wavelets modeling of inductance of interconnects in digital circuits of mixed-signal ICs
    Wang Jun
    2005 ASIA-PACIFIC MICROWAVE CONFERENCE PROCEEDINGS, VOLS 1-5, 2005, : 1279 - 1283
  • [23] Analog/Mixed-Signal Integrated Circuits for Quantum Computing
    Bardin, Joseph C.
    2020 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY SYMPOSIUM (BCICTS), 2020,
  • [24] Arithmetic Compaction Circuits for Mixed-Signal Systems Testing
    Geurkov, Vadim
    Kirischian, Lev
    2012 IEEE AUTOTESTCON PROCEEDINGS, 2012, : 330 - 334
  • [25] Device Technology for GaN Mixed-Signal Integrated Circuits
    Chen, Kevin Jing
    Kwan, Alex Man Ho
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2013, 52 (11)
  • [26] Substrate noise coupling in mixed-signal integrated circuits
    Shi, Yibing
    Chen, Guangju
    Wang, Houjun
    Dianzi Keji Daxue Xuebao/Journal of University of Electronic Science and Technology of China, 2000, 29 (02): : 174 - 177
  • [27] Routability analysis model for mixed-signal integrated circuits
    Li, Zhenrong
    Liu, Xiaoyan
    Zhang, Xisheng
    Beijing Daxue Xuebao (Ziran Kexue Ban)/Acta Scientiarum Naturalium Universitatis Pekinensis, 2007, 43 (01): : 61 - 66
  • [28] A family of instruments for testing mixed-signal circuits and systems
    Witte, RA
    HEWLETT-PACKARD JOURNAL, 1997, 48 (02): : 6 - 9
  • [29] Testing analogue and mixed-signal integrated circuits by weighted sum of selected node voltages
    Ko, KY
    Wong, MWT
    Lee, YS
    INTERNATIONAL JOURNAL OF ELECTRONICS, 2003, 90 (05) : 313 - 329
  • [30] DESIGN-FOR-TESTABILITY AUTOMATION OF MIXED-SIGNAL INTEGRATED CIRCUITS
    Mosin, Sergey
    2013 IEEE 26TH INTERNATIONAL SOC CONFERENCE (SOCC), 2013, : 244 - 249
12345