Modeling and Simulating Electromagnetic Fault Injection

被引：23
|
作者：
Dumont, M. [1 ]
Lisart, M. [1 ]
Maurine, P. [2 ]
机构：
[1] STMicroelectronics, Secure Microcontroller Div, F-13106 Rousset, France
[2] Univ Montpellier, LIRMM, F-34392 Montpellier, France
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2021年 / 40卷 / 04期
关键词：
Circuit faults; Integrated circuit modeling; Probes; Clocks; Wires; Computational modeling; Electromagnetic transients; fault diagnosis; integrated circuit reliability; modeling; security;
D O I：
10.1109/TCAD.2020.3003287
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Electromagnetic fault injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only a little information on how EMFI generates faults. Within this context, this article aims at filling this lack by proposing a complete understanding and modeling of EM induction on integrated circuits (ICs). The presented model is confronted to experiments to endorse its soundness.
引用
收藏
页码：680 / 693
页数：14
相关论文
共 50 条
  • [1] Modeling of Electromagnetic fault injection
    Dumont, Mathieu
    Maurine, Philippe
    Lisart, Mathieu
    [J]. 2019 12TH INTERNATIONAL WORKSHOP ON THE ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2019), 2019, : 246 - 248
  • [2] Design and Validation of a Platform for Electromagnetic Fault Injection
    Balasch, Josep
    Arumi, Daniel
    Manich, Salvador
    [J]. 2017 32ND CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS), 2017,
  • [3] Visualizing Electromagnetic Fault Injection With Timing Sensors
    Paquette, Michael
    Marquis, Brian
    Bainbridge, Rachel
    Chapman, Joe
    [J]. PROCEEDINGS OF THE 2021 IEEE INTERNATIONAL CONFERENCE ON PHYSICAL ASSURANCE AND INSPECTION ON ELECTRONICS (PAINE), 2021,
  • [4] Modeling/simulating the injection molding of isotactic polypropylene
    Hieber, CA
    [J]. POLYMER ENGINEERING AND SCIENCE, 2002, 42 (07): : 1387 - 1409
  • [5] Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack
    Liu, Qiang
    Guo, Longtao
    Tang, Honghui
    [J]. 2023 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE, 2023,
  • [6] Simulating the injection of magnetized plasma without electromagnetic precursor wave
    Kilian, Patrick
    Spanier, Felix
    [J]. JOURNAL OF COMPUTATIONAL PHYSICS, 2018, 353 : 258 - 263
  • [7] Simulating and modeling electromagnetic fields using symbolic computations
    Onbilgin, G
    Ari, N
    Ozgonenel, O
    [J]. 2003 IEEE International Symposium on Electromagnetic Compatibility (EMC), Vols 1 and 2, Symposium Record, 2003, : 1162 - 1165
  • [8] ElectroMagnetic Analysis and Fault Injection onto Secure Circuits
    Maistri, P.
    Leveugle, R.
    Bossuet, L.
    Aubert, A.
    Fischer, V
    Robisson, B.
    Moro, N.
    Maurine, P.
    Dutertre, J-M
    Lisart, M.
    [J]. 2014 22ND INTERNATIONAL CONFERENCE ON VERY LARGE SCALE INTEGRATION (VLSI-SOC), 2014,
  • [9] Genetic Algorithm-based Electromagnetic Fault Injection
    Maldini, Antun
    Samwel, Niels
    Picek, Stjepan
    Batina, Lejla
    [J]. 2018 WORKSHOP ON FAULT DIAGNOSIS AND TOLERANCE IN CRYPTOGRAPHY (FDTC), 2018, : 35 - 42
  • [10] Electromagnetic Fault Injection as a New Forensic Approach for SoCs
    Gaine, Clement
    Aboulkassimi, Driss
    Pontie, Simon
    Nikolovski, Jean-Pierre
    Dutertre, Jean-Max
    [J]. 2020 IEEE INTERNATIONAL WORKSHOP ON INFORMATION FORENSICS AND SECURITY (WIFS), 2020,
12345