Modeling of Electromagnetic fault injection

被引：0
|
作者：
Dumont, Mathieu [1 ,2 ]
Maurine, Philippe [2 ]
Lisart, Mathieu [1 ]
机构：
[1] ISTMicroelectronics, Rousset, France
[2] Univ Montpellier, LIRMM, Monptellier, France
来源：
2019 12TH INTERNATIONAL WORKSHOP ON THE ELECTROMAGNETIC COMPATIBILITY OF INTEGRATED CIRCUITS (EMC COMPO 2019) | 2019年
关键词：
Integrated circuits; EM fault injection; EMC modeling; fault model;
D O I：
10.1109/emccompo.2019.8919964
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Electromagnetic Fault Injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only little information on how EMFI generates faults. Within this context, this paper aims at filling this lack by proposing a complete modeling of EM induction on Integrated Circuit (IC). The introduced model is confronted to experimental data in order to demonstrate its robustness.
引用
收藏
页码：246 / 248
页数：3
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