Modeling and Simulating Electromagnetic Fault Injection

被引：23
|
作者：
Dumont, M. [1 ]
Lisart, M. [1 ]
Maurine, P. [2 ]
机构：
[1] STMicroelectronics, Secure Microcontroller Div, F-13106 Rousset, France
[2] Univ Montpellier, LIRMM, F-34392 Montpellier, France
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 2021年 / 40卷 / 04期
关键词：
Circuit faults; Integrated circuit modeling; Probes; Clocks; Wires; Computational modeling; Electromagnetic transients; fault diagnosis; integrated circuit reliability; modeling; security;
D O I：
10.1109/TCAD.2020.3003287
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Electromagnetic fault injection (EMFI) has recently gained popularity as a mean to induce faults because of its inherent advantages. Despite this popularity, there is only a little information on how EMFI generates faults. Within this context, this article aims at filling this lack by proposing a complete understanding and modeling of EM induction on integrated circuits (ICs). The presented model is confronted to experiments to endorse its soundness.
引用
收藏
页码：680 / 693
页数：14
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