PHASE-SENSITIVE X-RAY IMAGING AT THE SYRMEP BEAMLINE OF ELETTRA

被引：0

作者：

Tromba, G. ^{[1
]}

Arfelli, F. ^{[2
]}

Castelli, E. ^{[2
]}

Dreossi, D. ^{[2
]}

Longo, R. ^{[2
]}

Mancini, L. ^{[1
]}

Menk, R. H. ^{[1
]}

Montanari, F. ^{[1
]}

Olivo, A. ^{[2
]}

Pani, S. ^{[2
]}

Rigon, L. ^{[2
]}

Zanini, F. ^{[1
]}

机构：

[1] Sincrotrone Trieste, I-34012 Trieste, Italy

[2] Univ Trieste, Dept Phys, Trieste, Italy

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2002年 / 58卷

关键词：

PHASE IMAGING; PHASE CONTRAST RADIOLOGY; DIFFRACTION ENHANCED IMAGING;

D O I：

10.1107/S0108767302087184

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：C52 / C52

页数：1

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