Phase-sensitive imaging and phase tomography using X-ray interferometers

被引：244
|
作者：
Momose, A [1 ]
机构：
[1] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Bunkyo Ku, Tokyo 1130033, Japan
来源：
OPTICS EXPRESS | 2003年 / 11卷 / 19期
关键词：
D O I：
10.1364/OE.11.002303
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
X-ray interferometry for imaging applications is discussed with a review of X-ray interferometric imaging activities reported to date. Phase measurement and phase tomography based on X-ray interferometry are also presented. Finally the advantage of X-ray interferometric imaging in comparison with other phase-sensitive X-ray imaging methods is discussed. (C) 2003 Optical Society of America
引用
收藏
页码：2303 / 2314
页数：12
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