Hollow Atomic Force Microscopy Probes for Nanoscale Dispensing of Liquids

被引:0
|
作者
Meister, Andre [1 ]
Przybylska, Joanna [1 ]
Niedermann, Philippe [1 ]
Santschi, Christian [1 ]
Heinzelmann, Harry [1 ]
机构
[1] CSEM Swiss Ctr Elect & Microtechnol, CH-2002 Neuchatel, Switzerland
关键词
AFM; nanopatterning; microfluidic spotting; microarray;
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
To enable the printing of nanometer sized droplets with volumes in the femto and attoliter range and sub-micron droplet spacing, a nanoscale dispenser (NADIS) based on an atomic force microscopy probe has been developed and microfabricated. The probe consists of a cantilever with a hollow core, which is connected to a reservoir located in the chip. The hollow cantilever acts as a microfluidic channel that connects the reservoir to the dispensing tip located at the free end of the cantilever. The tip possesses an opening at its apex with a typical size of 200 nm, realized by focus ion beam milling. The transfer of liquid from the tip opening to the surface occurs by contacting the probe tip with the sample surface and is driven by capillary pressure alone. To overcome the serial manner of writing by using a single probe, arrays of hollow AFM probes were fabricated. The feasibility to dispense droplets in parallel has been demonstrated.
引用
收藏
页码:273 / 276
页数:4
相关论文
共 50 条
  • [1] Nanoscale dispensing in liquid environment of streptavidin on a biotin-functionalized surface using hollow atomic force microscopy probes
    Meister, Andre
    Polesel-Maris, Jerome
    Niedermann, Philippe
    Przybylska, Joanna
    Studer, Philipp
    Gabi, Michael
    Behr, Pascal
    Zambelli, Tomaso
    Liley, Martha
    Voeroes, Janos
    Heinzelmann, Harry
    [J]. MICROELECTRONIC ENGINEERING, 2009, 86 (4-6) : 1481 - 1484
  • [2] Hydrodynamics of torsional probes for atomic force microscopy in liquids
    Basak, Sudipta
    Beyder, Arthur
    Spagnoli, Chiara
    Raman, Arvind
    Sachs, Fredrick
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 102 (02)
  • [3] Nanoscale dispensing of liquids through cantilevered probes
    Meister, A
    Jeney, S
    Liley, M
    Akiyama, T
    Staufer, U
    de Rooij, NF
    Heinzelmann, H
    [J]. MICROELECTRONIC ENGINEERING, 2003, 67-8 : 644 - 650
  • [4] Hollow Atomic Force Microscopy Cantilevers with Nanoscale Wall Thicknesses
    Cha, Wujoon
    Campbell, Matthew F.
    Hasz, Kathryn
    Nicaise, Samuel M.
    Lilley, Drew E.
    Sato, Takaaki
    Carpick, Robert W.
    Bargatin, Igor
    [J]. SMALL, 2021, 17 (51)
  • [5] Fabrication of Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes to Image Surface Topography and Reactivity at the Nanoscale
    Velmurugan, Jeyavel
    Agrawal, Amit
    An, Sangmin
    Choudhary, Eric
    Szalai, Veronika A.
    [J]. ANALYTICAL CHEMISTRY, 2017, 89 (05) : 2687 - 2691
  • [6] Protocol for live imaging of intracellular nanoscale structures using atomic force microscopy with nanoneedle probes
    Ichikawa, Takehiko
    Alam, Mohammad Shahidul
    Penedo, Marcos
    Matsumoto, Kyosuke
    Fujita, Sou
    Miyazawa, Keisuke
    Furusho, Hirotoshi
    Miyata, Kazuki
    Nakamura, Chikashi
    Fukuma, Takeshi
    [J]. STAR PROTOCOLS, 2023, 4 (03):
  • [7] Evaluating probes for "electrical" atomic force microscopy
    Trenkler, T
    Hantschel, T
    Stephenson, R
    De Wolf, P
    Vandervorst, W
    Hellemans, L
    Malavé, A
    Büchel, D
    Oesterschulze, E
    Kulisch, W
    Niedermann, P
    Sulzbach, T
    Ohlsson, O
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (01): : 418 - 427
  • [8] Characterization of conductive probes for Atomic Force Microscopy
    Trenkler, T
    Hantschel, T
    Vandervorst, W
    Hellemans, L
    Kulisch, W
    Oesterschulze, E
    Niedermann, P
    Sulzbach, T
    [J]. DESIGN, TEST, AND MICROFABRICATION OF MEMS AND MOEMS, PTS 1 AND 2, 1999, 3680 : 1168 - 1179
  • [9] Atomic force microscopy probes go electrochemical
    Gardner, CE
    Macpherson, JV
    [J]. ANALYTICAL CHEMISTRY, 2002, 74 (21) : 576A - 584A
  • [10] Carbon nanotubes as probes for atomic force microscopy
    Stevens, RMD
    Frederick, NA
    Smith, BL
    Morse, DE
    Stucky, GD
    Hansma, PK
    [J]. NANOTECHNOLOGY, 2000, 11 (01) : 1 - 5