Carbon nanotubes as probes for atomic force microscopy

被引：107
|
作者：
Stevens, RMD
Frederick, NA
Smith, BL [1 ]
Morse, DE
Stucky, GD
Hansma, PK
机构：
[1] Univ Calif Santa Barbara, Dept Chem & Mat, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Mol Cellular & Dev Biol, Santa Barbara, CA 93106 USA
[3] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA
来源：
NANOTECHNOLOGY | 2000年 / 11卷 / 01期
关键词：
D O I：
10.1088/0957-4484/11/1/301
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Tip-derived artifacts remain one of the chief limitations of atomic force microscopy (AFM) when attempting to measure sub-nanometre structures. Carbon nanotubes represent ideal structures for use as AFM tips because of their small diameter, high aspect ratio and high strength. We attached single carbon nanotube AFM tips using a novel are discharge method. Using these modified tips, we successfully imaged a protein filament found in sponge spicules of Tethya aurantia. We report a modular stave-like structure for the protein filament that was previously unobservable with conventional AFM cantilevers.
引用
收藏
页码：1 / 5
页数：5
相关论文
共 50 条
  • [1] Robust operation and performance of integrated carbon nanotubes atomic force microscopy probes
    Rius, G.
    Clark, I. T.
    Yoshimura, M.
    [J]. 15TH INTERNATIONAL CONFERENCE ON THIN FILMS (ICTF-15), 2013, 417
  • [2] Carbon Nanotube atomic force microscopy probes
    Yamanaka, S
    Okawa, T
    Akita, S
    Nakayama, Y
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIX, PTS 1-3, 2005, 5752 : 1450 - 1456
  • [3] Atomic Force Microscopy Characterization of Carbon Nanotubes
    Bellucci, S.
    Gaggiotti, G.
    Marchetti, M.
    Micciulla, F.
    Mucciato, R.
    Regi, M.
    [J]. PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2007, 61 : 99 - 104
  • [4] Carbon nanotubes as tips for atomic force microscopy
    Guo, Li-Qiu
    Xu, Zong-Wei
    Zhao, Tie-Qiang
    Zhao, Qing-Liang
    Zhang, Fei-Hu
    Dong, Shen
    [J]. Journal of Harbin Institute of Technology (New Series), 2004, 11 (02) : 223 - 227
  • [5] Carbon nanotubes as tips for atomic force microscopy
    国立秋
    徐宗伟
    赵铁强
    赵清亮
    张飞虎
    董申
    [J]. Journal of Harbin Institute of Technology(New series), 2004, (02) : 223 - 227
  • [6] Attachment of carbon nanotubes to atomic force microscope probes
    Gibson, Christopher T.
    Carnally, Stewart
    Roberts, Clive J.
    [J]. ULTRAMICROSCOPY, 2007, 107 (10-11) : 1118 - 1122
  • [7] Fabrication of Carbon Nanotube Probes in Atomic Force Microscopy
    Xu, Z. W.
    Fang, F. Z.
    Hu, X. T.
    [J]. ADVANCES IN ABRASIVE TECHNOLOGY XII, 2009, 76-78 : 497 - 501
  • [8] Study on the manipulation of carbon nanotubes with atomic force microscopy
    Liu, SJ
    Shen, ZY
    Hou, SM
    Gu, ZN
    Xue, ZQ
    [J]. ACTA PHYSICO-CHIMICA SINICA, 2003, 19 (03) : 233 - 236
  • [9] Wear-resistance comparison of carbon nanotubes and conventional silicon-probes for atomic force microscopy
    Guo, LQ
    Wang, R
    Xu, HM
    Liang, J
    [J]. WEAR, 2005, 258 (11-12) : 1836 - 1839
  • [10] Fabrication and configuration of carbon nanotube probes in atomic force microscopy
    Fang, F. Z.
    Xu, Z. W.
    Zhang, G. X.
    Hu, X. T.
    [J]. CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2009, 58 (01) : 455 - 458
12345