Carbon nanotubes as probes for atomic force microscopy

被引：107
|
作者：
Stevens, RMD
Frederick, NA
Smith, BL [1 ]
Morse, DE
Stucky, GD
Hansma, PK
机构：
[1] Univ Calif Santa Barbara, Dept Chem & Mat, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Dept Mol Cellular & Dev Biol, Santa Barbara, CA 93106 USA
[3] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA
来源：
NANOTECHNOLOGY | 2000年 / 11卷 / 01期
关键词：
D O I：
10.1088/0957-4484/11/1/301
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Tip-derived artifacts remain one of the chief limitations of atomic force microscopy (AFM) when attempting to measure sub-nanometre structures. Carbon nanotubes represent ideal structures for use as AFM tips because of their small diameter, high aspect ratio and high strength. We attached single carbon nanotube AFM tips using a novel are discharge method. Using these modified tips, we successfully imaged a protein filament found in sponge spicules of Tethya aurantia. We report a modular stave-like structure for the protein filament that was previously unobservable with conventional AFM cantilevers.
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页码：1 / 5
页数：5
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