Combination of atomic force microscopy and photoluminescence microscopy for the investigation of individual carbon nanotubes on sapphire surfaces

被引：6
|
作者：
Jester, Stefan-Sven
Kiowski, Oliver
Lebedkin, Sergei
Hennrich, Frank
Fischer, Regina
Stuerzl, Ninette
Hawecker, Jacques
Kappes, Manfred M.
机构：
[1] Univ Karlsruhe, Inst Phys Chem, D-76128 Karlsruhe, Germany
[2] Forschungszentrum Karlsruhe, Inst Nanotechnol, D-76021 Karlsruhe, Germany
[3] Univ Karlsruhe, Electron Microscopy Lab, D-76128 Karlsruhe, Germany
来源：
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2007年 / 244卷 / 11期
关键词：
D O I：
10.1002/pssb.200776163
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Atomic force microscopy (AFM) and photoluminescence (PL) spectroscopy were applied to characterize single walled carbon nanotubes (SWNTs) deposited on sapphire. The electronic properties and structure of luminescent semiconducting SWNTs can be probed by PL spectroscopy. The diameter, length, spatial position, and angular orientation of deposited SWNTs can be accurately determined by intermittent contact AFM. We describe an approach to combine and compare the spectroscopic (PL) and topographical (AFM) information for the same individual nanotubes as well as nanotube aggregates. (c) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码：3973 / 3977
页数：5
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