Atomic force microscopy probes go electrochemical

被引：60
|
作者：
Gardner, CE [1 ]
Macpherson, JV [1 ]
机构：
[1] Univ Warwick, Dept Chem, Coventry CV4 7AL, W Midlands, England
来源：
ANALYTICAL CHEMISTRY | 2002年 / 74卷 / 21期
关键词：
D O I：
10.1021/ac0221482
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：576A / 584A
页数：9
相关论文
共 50 条
  • [1] Parylene Insulated Probes for Scanning Electrochemical-Atomic Force Microscopy
    Derylo, Maksymilian A.
    Morton, Kirstin C.
    Baker, Lane A.
    LANGMUIR, 2011, 27 (22) : 13925 - 13930
  • [2] Nanowire probes for high resolution combined scanning electrochemical Microscopy - Atomic force Microscopy
    Burt, DP
    Wilson, NR
    Weaver, JMR
    Dobson, PS
    Macpherson, JV
    NANO LETTERS, 2005, 5 (04) : 639 - 643
  • [3] Evaluating probes for "electrical" atomic force microscopy
    Trenkler, T
    Hantschel, T
    Stephenson, R
    De Wolf, P
    Vandervorst, W
    Hellemans, L
    Malavé, A
    Büchel, D
    Oesterschulze, E
    Kulisch, W
    Niedermann, P
    Sulzbach, T
    Ohlsson, O
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (01): : 418 - 427
  • [4] Carbon nanotubes as probes for atomic force microscopy
    Stevens, RMD
    Frederick, NA
    Smith, BL
    Morse, DE
    Stucky, GD
    Hansma, PK
    NANOTECHNOLOGY, 2000, 11 (01) : 1 - 5
  • [5] Characterization of conductive probes for Atomic Force Microscopy
    Trenkler, T
    Hantschel, T
    Vandervorst, W
    Hellemans, L
    Kulisch, W
    Oesterschulze, E
    Niedermann, P
    Sulzbach, T
    DESIGN, TEST, AND MICROFABRICATION OF MEMS AND MOEMS, PTS 1 AND 2, 1999, 3680 : 1168 - 1179
  • [6] Functionalization of aminomodified probes for atomic force microscopy
    Limanskii, A
    BIOFIZIKA, 2006, 51 (02): : 225 - 235
  • [7] Stressed metal probes for atomic force microscopy
    Hantschel, T
    Chow, EM
    Rudolph, D
    Fork, DK
    APPLIED PHYSICS LETTERS, 2002, 81 (16) : 3070 - 3072
  • [8] Optimization of cantilever probes for atomic force microscopy
    Pedersen, NL
    DESIGN, TEST, AND MICROFABRICATION OF MEMS AND MOEMS, PTS 1 AND 2, 1999, 3680 : 131 - 140
  • [9] Carbon Nanotube atomic force microscopy probes
    Yamanaka, S
    Okawa, T
    Akita, S
    Nakayama, Y
    METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XIX, PTS 1-3, 2005, 5752 : 1450 - 1456
  • [10] Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes
    Dobson, PS
    Weaver, JMR
    Holder, MN
    Unwin, PR
    Macpherson, JV
    ANALYTICAL CHEMISTRY, 2005, 77 (02) : 424 - 434
12345