High-precision index measurement in anisotropic crystals using white-light spectral interferometry

被引：41
|
作者：
Delbarre, H [1 ]
Przygodzki, C [1 ]
Tassou, M [1 ]
Boucher, D [1 ]
机构：
[1] Univ Littoral, MREID, Lab Physicochim Atmosphere, F-59140 Dunkerque, France
来源：
APPLIED PHYSICS B-LASERS AND OPTICS | 2000年 / 70卷 / 01期
关键词：
D O I：
10.1007/s003400050006
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
White-light spectral interferometry appears an excellent tool for precise determination of indices, and has already been successfully applied to different isotropic or weakly dispersive materials such as glass or rhodamine films. In this paper, we extend the spectral method to the measurement of anisotropic media with strong dispersion. The method is discussed below and allows an accuracy of the order of 10(-5) on the principal indices of a birefringent silver thiogallate (AgGaS2) crystal.
引用
收藏
页码：45 / 51
页数：7
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