High-precision index measurement in anisotropic crystals using white-light spectral interferometry

被引：41
|
作者：
Delbarre, H [1 ]
Przygodzki, C [1 ]
Tassou, M [1 ]
Boucher, D [1 ]
机构：
[1] Univ Littoral, MREID, Lab Physicochim Atmosphere, F-59140 Dunkerque, France
来源：
APPLIED PHYSICS B-LASERS AND OPTICS | 2000年 / 70卷 / 01期
关键词：
D O I：
10.1007/s003400050006
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
White-light spectral interferometry appears an excellent tool for precise determination of indices, and has already been successfully applied to different isotropic or weakly dispersive materials such as glass or rhodamine films. In this paper, we extend the spectral method to the measurement of anisotropic media with strong dispersion. The method is discussed below and allows an accuracy of the order of 10(-5) on the principal indices of a birefringent silver thiogallate (AgGaS2) crystal.
引用
收藏
页码：45 / 51
页数：7
相关论文
共 50 条
  • [41] High-precision white light interferometry based on a color CCD and peak matching algorithm
    Jaeseung Im
    Hyuntae Kim
    Woongkyu Park
    Jae Sung Ahn
    Byeongil Lee
    Soobong Choi
    [J]. Journal of the Korean Physical Society, 2022, 80 : 599 - 605
  • [42] Fast Surface Profiling by White-Light Interferometry Using Symmetric Spectral Optical Filter
    Hirabayashi, Akira
    [J]. IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2010, E93A (02) : 542 - 549
  • [43] Fundamental aspects of resolution and precision in vertical scanning white-light interferometry
    Lehmann, Peter
    Tereschenko, Stanislav
    Xie, Weichang
    [J]. SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES, 2016, 4 (02):
  • [44] Measuring parameters and characteristics of a fiber optic spectrometer using white-light spectral interferometry
    Hlubina, P
    Gurov, I
    Chugunov, V
    [J]. PHOTONICS, DEVICES, AND SYSTEMS II, 2003, 5036 : 78 - 83
  • [45] Measurement errors of mirrorlike, tilted objects in white-light interferometry
    Berger, Reinhard
    Sure, Thomas
    Osten, Wolfgang
    [J]. OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2, 2007, 6616
  • [46] High-precision broadband measurement of refractive index by picosecond real-time interferometry
    Tan, Zheng Jie
    Jin, Dafei
    Fang, Nicholas X.
    [J]. APPLIED OPTICS, 2016, 55 (24) : 6625 - 6629
  • [47] Influence of surface roughness on the measurement uncertainty of white-light interferometry
    Pavlicek, Pavel
    [J]. 16TH POLISH-SLOVAK-CZECH OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS, 2008, 7141
  • [48] Reduced measurement uncertainty of white-light interferometry on rough surfaces
    Gross, R.
    Hybl, O.
    Richter, C.
    Wiesner, B.
    Haeusler, G.
    [J]. SPECKLE06: SPECKLES, FROM GRAINS TO FLOWERS, 2006, 6341
  • [49] Measurement of the refractive index of an optical medium by using a white-light interferometer
    Nahm, KB
    Shin, ES
    Rhee, BK
    [J]. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 1996, 29 (06) : 724 - 727
  • [50] Theoretical measurement uncertainty of white-light interferometry on rough surfaces
    Pavlicek, P
    Soubusta, J
    [J]. APPLIED OPTICS, 2003, 42 (10) : 1809 - 1813
12345