Direct measurement of refractive-index dispersion of transparent media by white-light interferometry

被引：40
|
作者：
Galli, M [1 ]
Marabelli, F [1 ]
Guizzetti, G [1 ]
机构：
[1] Univ Pavia, INFM, Dipartimento Fis A Volta, I-27100 Pavia, Italy
来源：
APPLIED OPTICS | 2003年 / 42卷 / 19期
关键词：
D O I：
10.1364/AO.42.003910
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We report on a technique for measuring the refractive indices of nonabsorbing media over a broad spectral range from 0.5 to 5 mum. White-light interferometry based on a double-interferometer system consisting of a fixed Mach-Zehnder interferometer and a Fourier-transform spectrometer is used for direct measurement of the absolute rotation-dependent phase shift induced by an optical element. Refractive index n(lambda) over the whole investigated spectral range is thus obtained directly to an accuracy of 10(-4) without the need for any specific assumption about dispersion. Results for synthetic fused silica are presented and discussed. (C) 2003 Optical Society of America.
引用
收藏
页码：3910 / 3914
页数：5
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