Data-fused method of fault diagnosis for analog circuits

被引：2

作者：

Tan, Yanghong ^{[2
]}

He, Yigang ^{[2
]}

Sun, Yichuang ^{[1
]}

Yang, Hui ^{[2
,3
]}

Liu, Meirong ^{[2
]}

机构：

[1] Univ Hertfordshire, Sch Elect Commun & Elect Engn, Hatfield AL10 9AB, Herts, England

[2] Hunan Univ, Coll Elect & Informat Engn, Changsha 410082, Hunan, Peoples R China

[3] China Elect Prod Reliabil & Environm Testing Res, Guangzhou, Guangdong, Peoples R China

来源：

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING | 2009年 / 61卷 / 01期

基金：

中国国家自然科学基金;

关键词：

Analog circuits; Fault diagnosis; Current test; Data fusion; Wavelets; NEURAL-NETWORK APPROACH;

D O I：

10.1007/s10470-008-9266-6

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A data-fused fault diagnosis method based on wavelet packet decomposition of voltages of test nodes and current signals of the terminals stimulated is proposed in the paper. For the faults difficult to detect merely from voltages of test nodes, the current signals of the terminals which contain sufficient information with various faults are fused with the sampled node voltages of the circuit stimulated by the sources selected according to the principles proposed to make up for the insufficiency of the node voltages. This results in the maximization of feature vectors, more accurate classification of the faults and correct identification of the fuzzy sets of faults. © 2008 Springer Science+Business Media, LLC.

引用

页码：87 / 92

页数：6

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