Soft fault test and diagnosis for analog circuits

被引：0
|
作者：
Wang, P [1 ]
Yang, SY [1 ]
机构：
[1] Tsing Hua Univ, Dept Automat, Beijing 100084, Peoples R China
来源：
2005 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), VOLS 1-6, CONFERENCE PROCEEDINGS | 2005年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new SBT diagnosis approach for dealing with soft faults for analog circuits is presented in this paper. A serial of new fault models for analog components are provided and numerical method which can be easily implemented replaces circuit analysis to obtain the fault models before test. Tolerance issue and multi-fault diagnosis are also discussed in this paper.
引用
收藏
页码：2188 / 2191
页数：4
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