An approach to analog fault diagnosis using genetic algorithms

被引：9
|
作者：
Grasso, F [1 ]
Manetti, S [1 ]
Piccirilli, MC [1 ]
机构：
[1] Univ Florence, Dept Elect & Telecommun, I-50139 Florence, Italy
来源：
MELECON 2004: PROCEEDINGS OF THE 12TH IEEE MEDITERRANEAN ELECTROTECHNICAL CONFERENCE, VOLS 1-3 | 2004年
关键词：
D O I：
10.1109/MELCON.2004.1346785
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A procedure for the multifrequency fault diagnosis of analog circuits is presented. It permits, by means of an optimization procedure based on a genetic algorithm, to select the set of frequencies which better leads to locate parametric faults in analog circuits. By exploiting symbolic analysis techniques, a program implementing the proposed procedure has been developed. An example of application is also included.
引用
收藏
页码：111 / 114
页数：4
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