共 50 条
- [42] On-panel electrostatic discharge (ESD) protection design with thin-film transistor in LTPS process [J]. AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2, 2007, : 551 - 556
- [44] Latch-up Free ESD Protection Design With SCR Structure in Advanced CMOS Technology [J]. 2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2011,
- [46] Novel Drain-Less Multi-Gate pHEMT for Electrostatic Discharge (ESD) Protection in GaAs Technology [J]. 2013 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2013,
- [47] Advanced CMOS Technology Challenges for Robust ESD Design [J]. 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2022,
- [48] Design and Optimization of the NAND ESD Clamp in CMOS Technology [J]. 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2019,
- [49] Active electrostatic discharge (ESD) device for on-chip ESD protection in sub-quarter-micron complementary metal-oxide semiconductor (CMOS) process [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2004, 43 (1A-B): : L33 - L35
- [50] Active Electrostatic Discharge (ESD) Device for On-Chip ESD Protection in Sub-Quarter-Micron Complementary Metal-Oxide Semiconductor (CMOS) Process [J]. Ker, M.-D. (mdker@ieee.org), 1600, Japan Society of Applied Physics (43):