Advanced CMOS Technology Challenges for Robust ESD Design

被引：0
|
作者：
Chen, Shih-Hung [1 ]
机构：
[1] IMEC, Leuven, Belgium
来源：
2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS) | 2022年
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D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
TuT10
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页数：2
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