Dynamic element matching techniques for delta-sigma ADCS with large internal quantizers

被引:0
|
作者
Nordick, B [1 ]
Petrie, C [1 ]
Cheng, YJ [1 ]
机构
[1] Brigham Young Univ, Analog & Mixed Signal Circuits Lab, Provo, UT 84602 USA
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D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Increasing the quantizer resolution in a delta-sigma modulator can increase SNR, improve stability and reduce integrator power consumption. However, each added bit of quantizer resolution causes an exponential increase in the power dissipation, required area and complexity of the dynamic element matching (DEM) circuit required to attenuate DAC mismatch errors. This paper discusses the prospect of using a segmented feedback path with coarse and fine signals to reduce DEM complexity for modulators with large internal quantizers. Consequences of segmentation are presented, along with two potential solutions: one that uses calibration to cancel mismatch between coarse and fine DACs, and another that frequency-shapes this mismatch error. Analysis and behavioral simulation results are presented.
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收藏
页码:653 / 656
页数:4
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