Characterisation of Zener-diode-based electronic voltage standards.

被引：0
|
作者：
Armstrong, K [1 ]
Power, O [1 ]
Walsh, J [1 ]
机构：
[1] Dublin Inst Technol, Dublin 8, Ireland
来源：
METROLOGY - AT THE THRESHOLD OF THE CENTURY ARE WE READY? | 1999年
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D O I：
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In order to make optimum use of a group of Zener-diode-based electronic voltage standards as a laboratory standard for emf, it is necessary to characterise the individual standards in terms of temporal drift and the effects of environmental influences. An experimental set-up for the measurement of the temperature and pressure coefficients of electronic voltage standards is described and the results obtained for a number of commercial electronic voltage standards presented. The improvement in the overall accuracy of the group standard resulting from applying temperature and pressure corrections using derived coefficients is given.
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页码：111 / 118
页数：8
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