Non-contact temperature field measurement of solids by infrared multispectral thermotransmittance

被引：11
|
作者：
Pradere, C. [1 ]
Ryu, M. [2 ]
Sommier, A. [1 ]
Romano, M. [1 ]
Kusiak, A. [1 ]
Battaglia, J. L. [1 ]
Batsale, J. C. [1 ]
Morikawa, J. [2 ]
机构：
[1] CNRS, UMR 5295, Esplanade Arts & Metiers, TREFLE I2M, F-33405 Talence, France
[2] Tokyo Inst Technol, Dept Organ & Polymer Mat, Tokyo, Japan
来源：
JOURNAL OF APPLIED PHYSICS | 2017年 / 121卷 / 08期
关键词：
SPECTROSCOPY; THERMOREFLECTANCE; DEFLECTION; FREQUENCY;
D O I：
10.1063/1.4976209
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
This work aims to achieve contactless absolute-temperature measurements of infrared-semi-transparent solids using an infrared thermal and spectroscopic imaging technique. The multispectral thermotransmittance coefficient fields in the 3-5 mu m wavelength range for Sapphire, KBr, and Silicon are determined to be 6 x 10(-4) K-1, 4 x 10(-4) K-1, and -3 x 10(-3) K-1, respectively. The most interesting result is the high temperature-dependent transmittance coefficient in the middle wave infrared region. With these coefficients, the absolute temperature fields in a range from room temperature to 140 degrees C are shown.
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页数：7
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