Non-contact temperature field measurement of solids by infrared multispectral thermotransmittance

被引：11

作者：

Pradere, C. ^{[1
]}

Ryu, M. ^{[2
]}

Sommier, A. ^{[1
]}

Romano, M. ^{[1
]}

Kusiak, A. ^{[1
]}

Battaglia, J. L. ^{[1
]}

Batsale, J. C. ^{[1
]}

Morikawa, J. ^{[2
]}

机构：

[1] CNRS, UMR 5295, Esplanade Arts & Metiers, TREFLE I2M, F-33405 Talence, France

[2] Tokyo Inst Technol, Dept Organ & Polymer Mat, Tokyo, Japan

来源：

JOURNAL OF APPLIED PHYSICS | 2017年 / 121卷 / 08期

关键词：

SPECTROSCOPY; THERMOREFLECTANCE; DEFLECTION; FREQUENCY;

D O I：

10.1063/1.4976209

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This work aims to achieve contactless absolute-temperature measurements of infrared-semi-transparent solids using an infrared thermal and spectroscopic imaging technique. The multispectral thermotransmittance coefficient fields in the 3-5 mu m wavelength range for Sapphire, KBr, and Silicon are determined to be 6 x 10(-4) K-1, 4 x 10(-4) K-1, and -3 x 10(-3) K-1, respectively. The most interesting result is the high temperature-dependent transmittance coefficient in the middle wave infrared region. With these coefficients, the absolute temperature fields in a range from room temperature to 140 degrees C are shown.

引用

页数：7

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