Integrating III-V on Silicon for Future Nanoelectronics

被引:0
|
作者
Hudait, Mantu K. [1 ]
Chau, Robert [1 ]
机构
[1] Intel Corp, Components Res Technol & Mfg Grp, Hillsboro, OR 97124 USA
来源
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:12 / 13
页数:2
相关论文
共 50 条
  • [1] Heterogeneously Integrated III-V on Silicon for Future Nanoelectronics
    Hudait, Mantu K.
    [J]. DIELECTRICS FOR NANOSYSTEMS 5: MATERIALS SCIENCE, PROCESSING, RELIABILITY, AND MANUFACTURING -AND-TUTORIALS IN NANOTECHNOLOGY: MORE THAN MOORE - BEYOND CMOS EMERGING MATERIALS AND DEVICES, 2012, 45 (03): : 581 - 594
  • [2] Silicon and III-V nanoelectronics
    Datta, S
    Chau, R
    [J]. 2005 INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS, 2005, : 7 - 8
  • [3] Integrating III-V on silicon for future transistor applications
    Chau, Robert
    [J]. SOLID STATE TECHNOLOGY, 2008, 51 (07) : 30 - +
  • [4] III-V nanoelectronics
    Beaumont, SP
    [J]. MICROELECTRONIC ENGINEERING, 1996, 32 (1-4) : 283 - 295
  • [5] III-V/Si on silicon-on-insulator platform for hybrid nanoelectronics
    Prucnal, Slawomir
    Zhou, Shengqiang
    Ou, Xin
    Facsko, Stefan
    Liedke, Maciej Oskar
    Bregolin, Felipe
    Liedke, Bartosz
    Grebing, Jochen
    Fritzsche, Monika
    Huebner, Rene
    Muecklich, Arndt
    Rebohle, Lars
    Helm, Manfred
    Turek, Marcin
    Drozdziel, Andrzej
    Skorupa, Wolfgang
    [J]. JOURNAL OF APPLIED PHYSICS, 2014, 115 (07)
  • [6] III-V Nanoelectronics for Logic Applications
    Datta, Suman
    [J]. 2012 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT, 2012, : 26 - 26
  • [7] Integrating III-V quantum dot lasers on silicon substrates for silicon photonics
    Liao, M.
    Chen, S.
    Tang, M.
    Wu, J.
    Li, W.
    Kennedy, K.
    Ross, I.
    Seeds, A.
    Liu, H.
    [J]. SILICON PHOTONICS XII, 2017, 10108
  • [8] III-V semiconductor nanoelectronics for post Si era
    Hasegawa, Hideki
    [J]. IEEE NMDC 2006: IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE 2006, PROCEEDINGS, 2006, : 266 - 267
  • [9] Characterization and control of surfaces and interfaces for III-V nanoelectronics
    Hasegawa, H
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2003, 195 (01): : 9 - 17
  • [10] Surface passivation technology for III-V semiconductor nanoelectronics
    Hasegawa, Hideki
    Akazawa, Masamichi
    [J]. APPLIED SURFACE SCIENCE, 2008, 255 (03) : 628 - 632