III-V Nanoelectronics for Logic Applications

被引：0
|
作者：
Datta, Suman [1 ]
机构：
[1] Penn State Univ, University Pk, PA 16802 USA
来源：
2012 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT | 2012年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：26 / 26
页数：1
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