Study of a novel two mesas termination SiC Schottky barrier diode

被引:0
|
作者
Wang, Hui [1 ,2 ]
Jiang, Ling-Li [1 ,2 ]
Yu, Hong-Yu [1 ,2 ]
机构
[1] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
[2] Shenzhen Key Laborary Third Generat Semicond, Shenzhen 518055, Peoples R China
关键词
DESIGN;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A SiC Schottky barrier diode (SBD) with a novel junction termination structure including two mesas and one P+ guard ring was proposed and demonstrated. Under reverse bias, charge will be attracted to the position of guard ring instead of concentrating at the edge of Schottky junction due to the existence of the first mesa. In addition, the second mesa will further cause the high electronic field expanding vertically, thus optimizing the electronic field region distribution. The dependence of peak electric field on mesa dimensions and guard ring are studied systematically. It was found that the peak electric field was greatly affected by the first mesa height and the guard ring concentration, while there was no obvious variation tendency between the peak electric field and the first mesa width as well as the guard ring depth. Moreover, the thickness of SiC epi-layer can be used adequately and the area of SiC epl-layer can also be reduced for fabricating the same level devices.
引用
收藏
页码:1044 / 1046
页数:3
相关论文
共 50 条
  • [1] Edge termination study and fabrication of a 4H-SiC junction barrier Schottky diode
    陈丰平
    张玉明
    张义门
    汤晓燕
    王悦湖
    陈文豪
    [J]. Chinese Physics B, 2011, 20 (11) : 446 - 450
  • [2] Edge termination study and fabrication of a 4H-SiC junction barrier Schottky diode
    Chen Feng-Ping
    Zhang Yu-Ming
    Zhang Yi-Men
    Tang Xiao-Yan
    Wang Yue-Hu
    Chen Wen-Hao
    [J]. CHINESE PHYSICS B, 2011, 20 (11)
  • [3] Study of 4H-SiC junction barrier Schottky diode using field guard ring termination
    Chen Feng-Ping
    Zhang Yu-Ming
    Lue Hong-Liang
    Zhang Yi-Men
    Huang Jian-Hua
    [J]. CHINESE PHYSICS B, 2010, 19 (09)
  • [4] Study of 4H-SiC junction barrier Schottky diode using field guard ring termination
    陈丰平
    张玉明
    吕红亮
    张义门
    黄建华
    [J]. Chinese Physics B, 2010, 19 (09) : 519 - 522
  • [5] Compact modeling of SiC Schottky barrier diode and its extension to junction barrier Schottky diode
    Navarro, Dondee
    Herrera, Fernando
    Zenitani, Hiroshi
    Miura-Mattausch, Mitiko
    Yorino, Naoto
    Mattausch, Hans Jurgen
    Takusagawa, Mamoru
    Kobayashi, Jun
    Hara, Masafumi
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (04)
  • [6] Breakdown voltage characteristics of SiC Schottky barrier diode with aluminum deposition edge termination structure
    Kim, Seong-Jin
    Oh, Dong-Ju
    Yu, Soon-Jae
    [J]. JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2006, 49 : S768 - S773
  • [7] Design of vertical diamond Schottky barrier diode with a novel beveled junction termination extension
    Li, Dongshuai
    Wang, Tingting
    Lin, Wang
    Zhu, Ying
    Wang, Qiliang
    Lv, Xianyi
    Li, Liuan
    Zou, Guangtian
    [J]. DIAMOND AND RELATED MATERIALS, 2022, 128
  • [8] A Study of Edge Termination Field Plate Oxide Etch Angle for Optimize SiC Schottky Barrier Diode Breakdown Voltage Characteristics
    Hong, Young Sung
    Nam, Tae Jin
    Lee, Myong Hwan
    Kyoung, Sin Su
    Kang, Tai Young
    Lee, Sang Heon
    Chung, Hun-Seok
    Kang, Ey Goo
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2016, 16 (12) : 12936 - 12938
  • [9] The Design of Quasi-Super Junction and Novel Edge Termination in Junction Barrier Schottky Diode
    Hong, Jhen-Min
    Lai, Yun-Kai
    Tzou, Chen-Dong
    Lee, Kung-Yen
    Hsu, Chih-Chao
    [J]. 2019 IEEE 4TH INTERNATIONAL FUTURE ENERGY ELECTRONICS CONFERENCE (IFEEC), 2019,
  • [10] 600 v 100 a 4H-SiC junction barrier Schottky diode with guard rings termination
    Yamarnoto, Tsuyoshi
    Endo, Takeshi
    Kato, Nobuyuki
    Nakamura, Hiroki
    Sakakibara, Toshio
    [J]. SILICON CARBIDE AND RELATED MATERIALS 2006, 2007, 556-557 : 857 - 860