Influence of low energy ballistic electron on the transmittance properties of Au/Si interface studied by ballistic-electron-emission microscope

被引：1
|
作者：
Qiu, XH [1 ]
Shang, GY [1 ]
Wang, C [1 ]
Wang, NX [1 ]
Bai, CL [1 ]
机构：
[1] CHINESE ACAD SCI,INST CHEM,BEIJING 100080,PEOPLES R CHINA
来源：
CHINESE SCIENCE BULLETIN | 1997年 / 42卷 / 15期
关键词：
Au/Si interface; ballistic-electron-emission microscopy; transmittance probability;
D O I：
10.1007/BF02882760
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
[No abstract available]
引用
收藏
页码：1282 / 1286
页数：5
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