In this paper, we present a new differential p-channel multiple-time programmable (MTP) memory cell that is fully compatible with advanced 16 nm CMOS fin field-effect transistors (FinFET) logic processes. This differential MTP cell stores complementary data in floating gates coupled by a slot contact structure, which make different read currents possible on a single cell. In nanoscale CMOS FinFET logic processes, the gate dielectric layer becomes too thin to retain charges inside floating gates for nonvolatile data storage. By using a differential architecture, the sensing window of the cell can be extended and maintained by an advanced blanket boost scheme. The charge retention problem in floating gate cells can be improved by periodic restoring lost charges when significant read window narrowing occurs. In addition to high programming efficiency, this p-channel MTP cells also exhibit good cycling endurance as well as disturbance immunity. The blanket boost scheme can remedy the charge loss problem under thin gate dielectrics. (C) 2018 The Japan Society of Applied Physics.
机构:
Natl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, JapanNatl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, Japan
Kamoto, Mitsuo
Tanaka, Mieko
论文数: 0引用数: 0
h-index: 0
机构:
Natl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, JapanNatl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, Japan
Tanaka, Mieko
Yatsuo, Tsutomu
论文数: 0引用数: 0
h-index: 0
机构:
Natl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, JapanNatl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, Japan
Yatsuo, Tsutomu
Fukuda, Kenji
论文数: 0引用数: 0
h-index: 0
机构:
Natl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, JapanNatl Inst Adv Ind Sci & Technol, Power Elect Res Ctr, Tsukuba, Ibaraki 3058568, Japan
机构:
Univ Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, JapanUniv Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, Japan
Yokoyama, Masafumi
Yokoyama, Haruki
论文数: 0引用数: 0
h-index: 0
机构:
NTT Corp, NTT Device Technol Labs, Atsugi, Kanagawa 2430198, JapanUniv Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, Japan
Yokoyama, Haruki
Takenaka, Mitsuru
论文数: 0引用数: 0
h-index: 0
机构:
Univ Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, JapanUniv Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, Japan
Takenaka, Mitsuru
Takagi, Shinichi
论文数: 0引用数: 0
h-index: 0
机构:
Univ Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, JapanUniv Tokyo, Dept Elect Engn & Informat Syst, Bunkyo Ku, 2-11-16 Yayoi, Tokyo 1130032, Japan
机构:
Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
JST CREST, Bunkyo Ku, Tokyo 1138656, Japan
Beijing Normal Univ, Coll Nucl Sci & Technol, Beijing 100875, Peoples R ChinaUniv Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
Zhao, Dan Dan
Lee, Choong Hyun
论文数: 0引用数: 0
h-index: 0
机构:
Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
JST CREST, Bunkyo Ku, Tokyo 1138656, JapanUniv Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
Lee, Choong Hyun
Nishimura, Tomonori
论文数: 0引用数: 0
h-index: 0
机构:
Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
JST CREST, Bunkyo Ku, Tokyo 1138656, JapanUniv Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
Nishimura, Tomonori
Nagashio, Kosuke
论文数: 0引用数: 0
h-index: 0
机构:
Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
JST CREST, Bunkyo Ku, Tokyo 1138656, JapanUniv Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
Nagashio, Kosuke
Cheng, Guo An
论文数: 0引用数: 0
h-index: 0
机构:
Beijing Normal Univ, Coll Nucl Sci & Technol, Beijing 100875, Peoples R ChinaUniv Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
Cheng, Guo An
Toriumi, Akira
论文数: 0引用数: 0
h-index: 0
机构:
Univ Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan
JST CREST, Bunkyo Ku, Tokyo 1138656, JapanUniv Tokyo, Dept Mat Engn, Bunkyo Ku, Tokyo 1138656, Japan