Lock-in thermal IR imaging using a solid immersion lens

被引:26
|
作者
Breitenstein, O.
Altmann, F.
Riediger, T.
Karg, D.
Gottschalk, V.
机构
[1] Max Planck Inst Microstruct Phys, D-06120 Halle, Germany
[2] Fraunhofer Inst Mech Mat, D-06120 Halle, Germany
[3] Thermosensorik GmbH, D-91058 Erlangen, Germany
[4] ELMOS Semicond AG, D-44227 Dortmund, Germany
关键词
Infrared imaging;
D O I
10.1016/j.microrel.2006.07.027
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A hemispherical silicon solid immersion lens (SIL) was used to improve the spatial resolution of front-side thermal IR imaging in lock-in mode. The bottom of the SIL was cone-shaped to reduce the footprint of the SIL to the size of the imaged region. Caused by the lock-in operation mode, the detection limit improves by 2-3 orders of magnitude, and scattered light does not limit the image contrast. By using this SIL in combination with an IR camera working in the 3-5 mu m wavelength range, a spatial resolution of 1.4 mu m was obtained for thermal IR imaging. An automatic SIL positioning facility was constructed to place the SIL exactly in the center of the imaged region and to easily remove it after the detailed investigation.
引用
收藏
页码:1508 / 1513
页数:6
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