Defects Identified in SiC and Their Implications

被引:2
|
作者
Bockstedte, M. [1 ,2 ]
Marini, A. [3 ,4 ]
Gali, A. [5 ]
Pankratov, O. [1 ]
Rubio, A. [2 ]
机构
[1] Univ Erlangen Nurnberg, Theoret Festkorperphys, Staudtstr 7B2, D-91058 Erlangen, Germany
[2] Univ Pais Vasco UPV EHU, Dept Fis Mat, European Theoret Spect Facil, San Sebastian 20018, Spain
[3] Univ Roma Tor Vergata, CNISM, CNR INFM Inst Stat Mech & Complex, European Theoret Spect Facil, I-00133 Rome, Italy
[4] Univ Roma Tor Vergata, Dipartimento Fis, I-00133 Rome, Italy
[5] Budapest Univ Technol & Econ, Dept Atom Phys, H-1111 Budapest, Hungary
关键词
vacancy-related centers; optical excitation; hyperfine tensors; photo-EPR; quasi particles; excitonic effects; ELECTRON-PARAMAGNETIC-RESONANCE; CARBON VACANCY; 4H;
D O I
10.4028/www.scientific.net/MSF.600-603.285
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Defect signatures, such as deep level positions, hyperfine parameters, local vibrational modes and optical transitions characterize a defect and enable the identification of defect centers. This identification is a key to an understanding of complex phenomena like the defect kinetics. Albeit density functional theory enabled the identification of several defects and their kinetic properties, a new approach is needed to address the optical excitation of defect. Within a quasiparticle theory and taking into account excitonic effects we analyze the excited states of V-C(+).
引用
收藏
页码:285 / +
页数:2
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