Measurement of thermal expansion coefficients by electronic speckle pattern interferometry at high temperature

被引：14
|
作者：
Kim, KS
Kim, JH
Lee, JK
Jarng, SS
机构：
[1] CHOSUN UNIV,DEPT MAT ENGN,KWANGJU 501759,SOUTH KOREA
[2] CHOSUN UNIV,DEPT CONTROL & MEASUREMENT ENGN,KWANGJU 501759,SOUTH KOREA
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 1997年 / 16卷 / 21期
关键词：
D O I：
10.1023/A:1018527525996
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1753 / 1756
页数：4
相关论文
共 50 条
  • [1] Measurement of thermal expansion coefficients by electronic speckle pattern interferometry at high temperature
    Chosun Univ, Kwangju, Korea, Republic of
    [J]. J Mater Sci Lett, 21 (1753-1756):
  • [2] MEASUREMENT OF THERMAL-EXPANSION OF A PISTON USING HOLOGRAPHIC AND ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    RATNAM, MM
    EVANS, WT
    TYRER, JR
    [J]. OPTICAL ENGINEERING, 1992, 31 (01) : 61 - 69
  • [3] Characterisation of thermal expansion coefficient of anisotropic materials by electronic speckle pattern interferometry
    Dudescu, C.
    Naumann, J.
    Stockmann, M.
    Nebel, S.
    [J]. STRAIN, 2006, 42 (03) : 197 - 205
  • [4] A study on the measurement of in-plane displacement at high temperature by electronic speckle pattern interferometry method
    Kim, KS
    Kim, HT
    Cha, YH
    Jung, HC
    Jarng, SS
    Kim, JY
    Yang, SP
    [J]. REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B, 1998, : 1801 - 1808
  • [5] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY MEASUREMENT OF RESIDUAL STRESS
    Sedivy, Otomar
    Krempaszky, Christian
    Holy, Stanislav
    [J]. 25TH DANUBIA-ADRIA SYMPOSIUM ON ADVANCES IN EXPERIMENTAL MECHANICS, 2008, : 229 - 230
  • [6] THERMAL-EXPANSION TENSOR MEASUREMENT BY SPECKLE INTERFEROMETRY
    GASCON, F
    SALAZAR, F
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (08): : 2241 - 2244
  • [7] Electronic speckle pattern interferometry deformation measurement on lightweight structures under thermal load
    Hack, E
    Brönnimann, R
    [J]. OPTICS AND LASERS IN ENGINEERING, 1999, 31 (03) : 213 - 222
  • [8] INTERFEROMETRIC MEASUREMENTS OF HIGH-TEMPERATURE OBJECTS BY ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, OJ
    MALMO, JT
    SLETTEMOEN, GA
    [J]. APPLIED OPTICS, 1985, 24 (19): : 3167 - 3172
  • [9] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, O
    [J]. PHYSICS IN TECHNOLOGY, 1980, 11 (01): : 16 - 22
  • [10] Measurement of in plane strain with shearography and electronic speckle pattern interferometry
    Martinez, Amalia
    Rayas, J. A.
    Cordero, Raul
    [J]. OPTICAL MEASUREMENT TECHNIQUES FOR STRUCTURES AND SYSTEMS, 2009, : 217 - +
12345