An Efficient Fault Diagnosis and Localization Algorithm for Successive-Approximation Analog to Digital Converters

被引：0

作者：

Melkumyan, T. ^{[1
]}

Harutyunyan, G. ^{[1
]}

Shoukourian, S. ^{[1
]}

Vardanian, V. ^{[1
]}

Zorian, Y. ^{[1
]}

机构：

[1] Synopsys, Mountain View, CA 94043 USA

来源：

PROCEEDINGS OF IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS 2013) | 2013年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we have proposed an efficient fault diagnosis and localization algorithm for Successive-Approximation Register Analog to Digital Converters (SAR ADCs). A wide range of faults on ADC analog and digital parts, as well as faults on input signals are considered. The proposed algorithm uses a built-in self-test (BIST), which implies at-speed test of an ADC using histogram method. After the test is completed, the data collected during production test is stored in a memory and in special registers. Based on this information, fault diagnosis and localization of ADC faults are done.

引用

页数：4

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