A System-Level Modeling Approach for Simulating Radiation Effects in Successive-Approximation Analog-to-Digital Converters

被引：1

作者：

Rony, M. W. ^{[1
]}

Zhang, En Xia ^{[1
]}

Reaz, Mahmud ^{[1
]}

Li, Kan ^{[1
]}

Daniel, Andrew ^{[2
]}

Rax, Bernard ^{[2
]}

Adell, Philippe ^{[2
]}

Kauppila, Jeffrey ^{[1
]}

Karsai, Gabor ^{[1
]}

Holman, Tim ^{[1
]}

Reed, Robert A. ^{[1
]}

Witulski, Arthur ^{[1
]}

Schrimpf, Ronald D. ^{[1
]}

机构：

[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA

[2] Jet Prop Lab, Pasadena, CA 91109 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2021年 / 68卷 / 07期

关键词：

Calibration; Degradation; Integrated circuit modeling; Transfer functions; Data models; Computational modeling; Analog-digital conversion; Analog-to-digital converter (ADC); behavioral model; Eldo; Questa platform; successive-approximation-register (SAR); total ionizing dose (TID); Verilog-AMS; SAR ADC;

D O I：

10.1109/TNS.2021.3077944

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Analog-to-digital converters (ADCs) with different topologies respond differently to total ionizing dose (TID). A flexible behavioral modeling approach is proposed for system-level simulation of TID effects in successive-approximation-register (SAR) ADCs. The radiation-enabled approach can be adapted for a wide range of ADCs of various resolutions, clock speeds, and manufacturers. The empirical model is calibrated and validated, pre-rad and post-rad, for a particular ADC. Pre-rad calibration is performed by introducing distributions of static parameters corresponding to datasheet specifications. The post-rad calibration is accomplished by introducing error sources associated with the comparator and digital-to-analog converter (DAC), corresponding to experimental data. The calibrated model is used to examine the dynamic performance and to estimate the probability of parametric failure during the mission lifetime.

引用

页码：1465 / 1472

页数：8

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