Design for Test and Diagnosis of Power Switches

被引：0

作者：

Valka, Miroslav ^{[1
]}

Bosio, Alberto ^{[2
]}

Dilillo, Luigi ^{[2
]}

Girard, Patrick ^{[2
]}

Virazel, Arnaud ^{[2
]}

Debaud, Philippe ^{[3
]}

Guilhot, Stephane ^{[3
]}

机构：

[1] Grenoble Alpes Univ, TIMA Lab, Grenoble, France

[2] Univ Montpellier, LIRMM Lab, F-34059 Montpellier, France

[3] ST Microelect, Grenoble, France

来源：

JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS | 2016年 / 25卷 / 03期

关键词：

Design for test and diagnosis; low power design; power gating; power switches; REDUCTION;

D O I：

10.1142/S0218126616400132

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Power gating techniques have been adopted so far to reduce the static power consumption of integrated circuits (ICs). Power gating is usually implemented by means of several power switches (PSs). Manufacturing defects affecting PSs can lead to increase in the actual static power consumption and, in the worst case, they can completely isolate a functional block in the IC. Thus, efficient test and diagnosis solutions are needed. In this paper, we present a novel Design for Test and Diagnosis (DfTD) solution able to increase the test quality and diagnosis accuracy of PSs. The proposed approach has been validated through SPICE simulations on ITC'99 benchmark circuits as well as on industrial test cases.

引用

页数：18

共 50 条

[21] High peak power test of S-band waveguide switches
Argonne Natl Lab, Argonne, United States
Proc IEEE Part Accel Conf, (3174-3176):
[22] High peak power test of S-band waveguide switches
Nassiri, A
Grelick, A
Kustom, RL
White, M
PROCEEDINGS OF THE 1997 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-3: PLENARY AND SPECIAL SESSIONS ACCELERATORS AND STORAGE RINGS, 1998, : 3174 - 3176
[23] EMC Robust Design for Smart Power High Side Switches
Del Croce, Paolo
Deutschmann, Bernd
ANALOG CIRCUIT DESIGN: ROBUST DESIGN, SIGMA DELTA CONVERTERS, RFID, 2011, : 89 - +
[24] Design and Analysis of the Gate Driver Circuit for Power Semiconductor Switches
Kumar, Ashutosh
Mandal, R. K.
Raushan, Ravi
Gauri, Pratyush
2020 INTERNATIONAL CONFERENCE ON EMERGING FRONTIERS IN ELECTRICAL AND ELECTRONIC TECHNOLOGIES (ICEFEET 2020), 2020,
[25] Power and Design for Test: A Design Automation Perspective
De Colle, Aurelia
Ramnath, Sanjay
Hirech, Mokhtar
Chebiyam, Subramanian
JOURNAL OF LOW POWER ELECTRONICS, 2005, 1 (01) : 73 - 84
[26] Design and test of passively operated heat switches for 0.2 to 15 K
DiPirro, MJ
Shirron, PJ
Tuttle, JG
Canavan, ER
ADVANCES IN CRYOGENIC ENGINEERING, VOLS. 49A AND B, 2004, 710 : 436 - 442
[27] Design and Test of HTS Power Converting System With Multiple Magnets Considering Various Sequential Controls of Heater-Triggered Switches
Lee, Jeyull
Park, Young Gun
Jo, Hyun Chul
Kim, Ho Min
Chung, Yoon Do
Chu, Yong
Ko, Tae Kuk
Yoon, Yong Soo
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2016, 26 (03)
[28] Design, development and verification of a new multilevel inverter for reduced power switches
Mahato, Bidyut
Ranjan, Mrinal
Pal, Pradipta Kumar
Gupta, Santosh Kumar
Mahto, Kailash Kumar
ARCHIVES OF ELECTRICAL ENGINEERING, 2022, 71 (04) : 1051 - 1063
[29] Controller Design of a New DC Power Supply With Reduced Number of Switches
Dastfan, Ali
Behrangi, Farshid
2008 PROCEEDINGS OF THE 43RD INTERNATIONAL UNIVERSITIES POWER ENGINEERING CONFERENCE, VOLS 1-3, 2008, : 1193 - 1197
[30] Design of Interface ASIC with Power-Saving Switches for Capacitive Accelerometers
Cai, Juncheng
Cai, Yongbin
Li, Xiangyu
Wang, Shanshan
Zhang, Xiaowei
Di, Xinpeng
Wang, Pengjun
MICROMACHINES, 2025, 16 (01)

← 1 2 3 4 5 →