Soft Fault Diagnosis of Analog Circuits via Frequency Response Function Measurements

被引：18

作者：

Xie, Yongle ^{[1
]}

Li, Xifeng ^{[1
]}

Xie, Sanshan ^{[2
]}

Xie, Xuan ^{[1
]}

Zhou, Qizhong ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, Sch Automat Engn, Chengdu 611731, Peoples R China

[2] Chengdu Technol Univ, Chengdu 611730, Peoples R China

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2014年 / 30卷 / 02期

基金：

中国国家自然科学基金;

关键词：

Analog circuit; Component tolerance; Soft fault; Frequency response function; Fisher information; FISHER INFORMATION; SELECTION;

D O I：

10.1007/s10836-014-5445-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper provides a novel method for single and multiple soft fault diagnosis of analog circuits. The method is able to locate the faulty elements and evaluate their parameters. It employs the information contained in the frequency response function (FRF) measurements and focuses on finding models of the circuit under test (CUT) as exact as possible. Consequently, the method is capable of getting different sets of the parameters which are consistent with the diagnostic test, rather than only one specific set. To fulfil this purpose, the local plolynomial approach is applied and the associated normalized FRF is developed.The proposed method is especially suitable at the pre-production stage, where corrections of the technological design are important and the diagnostic time is not crucial. Two experimental examples are presented to clarify the proposed method and prove its efficiency.

引用

页码：243 / 249

页数：7

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