The response surface methods and the simplex optimization for fault diagnosis in analog integrated circuits

被引:0
|
作者
Vázquez-González, JL [1 ]
Flores-Verdad, GE [1 ]
机构
[1] Univ Americas Puebla, Dept Elect, Cholula, Mexico
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper demonstrates how the response surface methods and the simplex optimization can be applied in the fault diagnosis of analog integrated circuits. The method use regression techniques to get models that approximate the performance of the analog integrated circuit. With the constructed models and simplex method is possible to find the fault of the circuit when it is tested.
引用
收藏
页码:496 / 499
页数:4
相关论文
共 50 条
  • [1] Hierarchical fault diagnosis of analog integrated circuits
    Ho, CK
    Shepherd, PR
    Eberhardt, F
    Tenten, W
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2001, 48 (08) : 921 - 929
  • [2] The Analysis of Analog Circuits Fault Diagnosis Methods
    Zhang, Zhiqiang
    Zhang, Aihua
    [J]. PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON ELECTRONIC, MECHANICAL, INFORMATION AND MANAGEMENT SOCIETY (EMIM), 2016, 40 : 849 - 853
  • [3] Combined Optimization of Neural Network Fault Diagnosis Methods for Analog Circuits on Ships
    Guo, Sumin
    Li, Hongyu
    Wu, Bo
    Zhou, Jingyu
    Su, Chunjian
    Guan, Chao
    [J]. JOURNAL OF COASTAL RESEARCH, 2020, : 158 - 164
  • [4] Excitation optimization in fault diagnosis of analog electronic circuits
    Chruszczyk, L.
    Rutkowski, J.
    [J]. 2008 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, PROCEEDINGS, 2008, : 279 - 282
  • [5] Improvement of the Search Method for Parametric Fault Diagnosis of Analog Integrated Circuits
    Halgas, Stanislaw
    Tadeusiewicz, Michal
    [J]. PROCEEDINGS OF THE 23RD INTERNATIONAL CONFERENCE ON MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS (MIXDES 2016), 2016, : 359 - 362
  • [6] Study on analog circuits fault diagnosis
    [J]. 2000, Sci Publ House (21):
  • [7] Fault Diagnosis for Linear Analog Circuits
    Jun Weir Lin
    Chung Len Lee
    Chau Chin Su
    Jwu-E. Chen
    [J]. Journal of Electronic Testing, 2001, 17 : 483 - 494
  • [8] Fault diagnosis for linear analog circuits
    Lin, JW
    Lee, CL
    Su, CC
    Chen, JE
    [J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2001, 17 (06): : 483 - 494
  • [9] Fault diagnosis for linear analog circuits
    Lin, JW
    Lee, CL
    Su, CC
    Chen, JE
    [J]. PROCEEDINGS OF THE NINTH ASIAN TEST SYMPOSIUM (ATS 2000), 2000, : 25 - 30
  • [10] FAULT-DIAGNOSIS OF ANALOG CIRCUITS
    BANDLER, JW
    SALAMA, AE
    [J]. PROCEEDINGS OF THE IEEE, 1985, 73 (08) : 1279 - 1325