Electronic transport in graphene nanoribbons with correlated line-edge roughness

被引:2
|
作者
Mazaherifar, Mohsen [1 ]
Mojibpour, Ali [1 ]
Pourfath, Mandi [1 ]
机构
[1] Univ Tehran, Coll Engn, Sch Elect & Comp Engn, Tehran 14395515, Iran
关键词
graphene; nanoribbon; line-edge roughness; cross correlation; quantum transport; localization; QUANTUM TRANSPORT; SIMULATION; LER; LWR;
D O I
10.1088/1361-6463/ab28fd
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this paper, the impact of correlation between two line-edge roughnesses (LERs) on electronic transport in armchair graphene nanoribbons (AGNRs) is investigated, employing an atomistic model based on the non-equilibrium Greens function formalism. For demonstrating the influence of this correlation, crucial transport properties like mean free path and localization lengths corresponding to different sets of roughnesses and geometrical parameters are extracted. The results indicate the substantial role of the degree of cross-correlation in transport characteristics. Besides, for showing its importance in practice, some parameters in an AGNR-based field effect transistor relating to diverse correlations are provided. Additionally, an analytical compact model is developed to formulate conductance as a function of cross-correlation coefficient. The presented results offer novel insights into electronic transport in GNRs casting light on how the correlation of LERs should be regarded as the decisive factor in choosing an experimental approach for fabrication of GNRs.
引用
收藏
页数:9
相关论文
共 50 条
  • [1] Electronic properties of graphene nanoribbons with line-edge roughness doped with nitrogen and boron
    Wong, Kien Liong
    Chuan, Mu Wen
    Hamzah, Afiq
    Rusli, Shahrizal
    Alias, Nurul Ezaila
    Sultan, Suhana Mohamed
    Lim, Cheng Siong
    Tan, Michael Loong Peng
    [J]. PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2020, 117 (117):
  • [2] A Numerical Study of Line-Edge Roughness Scattering in Graphene Nanoribbons
    Yazdanpanah, Arash
    Pourfath, Mahdi
    Fathipour, Morteza
    Kosina, Hans
    Selberherr, Siegfried
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2012, 59 (02) : 433 - 440
  • [3] The Effect of Line-Edge Roughness on Electronic Transport Characteristics of a Graphene Nanoribbon Rectifier
    Golzani, Mozhgan
    Haji-Nasiri, Saeed
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2018, 47 (10) : 6067 - 6077
  • [4] The Effect of Line-Edge Roughness on Electronic Transport Characteristics of a Graphene Nanoribbon Rectifier
    Mozhgan Golzani
    Saeed Haji-Nasiri
    [J]. Journal of Electronic Materials, 2018, 47 : 6067 - 6077
  • [5] An Analytical Model for Line-Edge Roughness Limited Mobility of Graphene Nanoribbons
    Goharrizi, Arash Yazdanpanah
    Pourfath, Mahdi
    Fathipour, Morteza
    Kosina, Hans
    Selberherr, Siegfried
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (11) : 3725 - 3735
  • [6] Line-Edge Roughness Effects on the Electronic Properties of Armchair Black Phosphorene Nanoribbons
    Moez, Mahsa
    Karamitaheri, Hossein
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (10) : 5114 - 5119
  • [7] Line-Edge Roughness
    Mack, Chris A.
    Conley, Will
    [J]. JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2010, 9 (04):
  • [8] Simulation of Correlated Line-Edge Roughness in Multi-Gate Devices
    Jiang, Xiaobo
    Wang, Runsheng
    Huang, Ru
    Chen, Jiang
    [J]. 2013 18TH INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2013), 2013, : 123 - 126
  • [9] Line-edge roughness, part 2
    Mack, Chris A.
    [J]. MICROLITHOGRAPHY WORLD, 2007, 16 (02): : 12 - 14
  • [10] Resist blur and line-edge roughness
    Gallatin, GM
    [J]. MICROLITHOGRAPHY WORLD, 2005, 14 (03): : 4 - +